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sputter Growing FailureAnlaysis PinpointPFM AlkaneFilm Gallium_Arsenide HardDisk thermal_property Potential LeakageCurrent Memory Nanofiber Semiconductor EvatecAG ContactModeDot flakes VinylAlcohol CopperFoil C_AFM Sic Device ShenYang Monisha exfoliate ScanningKelvinProbeMicroscopy DiffractiveOpticalElements bias_mode aluminum_nitride Temperature HardDiskMedia GaP FAFailureAnlaysis Ni81Fe19 Singapore Leakage
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sputter Growing FailureAnlaysis PinpointPFM AlkaneFilm Gallium_Arsenide HardDisk thermal_property Potential LeakageCurrent Memory Nanofiber Semiconductor EvatecAG ContactModeDot flakes VinylAlcohol CopperFoil C_AFM Sic Device ShenYang Monisha exfoliate ScanningKelvinProbeMicroscopy DiffractiveOpticalElements bias_mode aluminum_nitride Temperature HardDiskMedia GaP FAFailureAnlaysis Ni81Fe19 Singapore Leakage